KLA-Tencor Trademarks

I-PAT

Filed: June 1, 2017
Computer hardware; semiconductor and wafer defect inspection systems; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing in the automotive industry; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in detecting defective semiconductor electronic components
Serial Number: 87472061
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2017-06-05

PROAIM

Filed: September 20, 2016
Computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and…
Serial Number: 87176971
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2016-09-23

XSIDE

Filed: June 16, 2016
Die sorter inspection and metrology testing equipment comprised of optical and infrared inspectors and lasers for use in the manufacturing, testing and inspection of wafers, semiconductors, and integrated circuits; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers
Serial Number: 87074433
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2016-06-20

FLASHSCAN

Filed: March 10, 2016
Photomask blank inspection tool for the use in the manufacturing, testing and inspection of photomask blanks; computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and photomask blanks; computer software for use in process control and yield management for the photomask blanks, semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and…
Serial Number: 86935805
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2016-03-14

KTDESIGNWORKS

Filed: November 12, 2015
Computer hardware; semiconductor and wafer defect inspection systems; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; a feature of semiconductor and wafer defect inspection systems for improving the detection of defects on advanced…
Serial Number: 86818669
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-11-16

5D ANALYZER

Filed: July 14, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics
Serial Number: 86692558
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-07-17

5D PATTERNING CONTROL SOLUTION

Filed: July 14, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics
Serial Number: 86692587
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-07-17

CIRCL-EDGE

Filed: June 4, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools for semiconductor wafer shape metrology and wafer…
Serial Number: 86652199
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-06-08

CIRCL-FOCUS

Filed: June 4, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools for semiconductor wafer shape metrology and wafer…
Serial Number: 86652230
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-06-08

CIRCL-AP

Filed: April 8, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools for semiconductor wafer shape metrology and wafer…
Serial Number: 86591516
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-04-11

VALUE@VELOCITY

Filed: September 18, 2014
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 86399095
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2014-09-22

ASI

Filed: September 16, 2014
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 86396509
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2014-09-19

BRI

Filed: September 16, 2014
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 86396566
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2014-09-19

DISCOVERY AT THE SPEED OF LIGHT

Filed: September 5, 2014
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 86386785
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2014-09-09

3DWAVE

Filed: August 15, 2014
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 86367971
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2014-08-19

ENABLING THE DIGITAL AGE

Filed: March 26, 2013
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 85886985
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2013-03-29

XCRACK

Filed: March 26, 2013
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 85887013
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2013-03-29

XPORT

Filed: March 6, 2013
Computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 85868933
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2013-03-09

APVI

Filed: August 2, 2012
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 85693662
Classification: Electrical and scientific apparatus
Status: Notice Of Allowance - Issued
Status Date: 2013-03-05

XPVI

Filed: August 2, 2012
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Serial Number: 85693683
Classification: Electrical and scientific apparatus
Status: Notice Of Allowance - Issued
Status Date: 2013-03-05