KLA-Tencor Trademarks

SHAPESHIFT

Filed: June 6, 2019
Computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; computer software for providing analytic data on the performance of inspection and metrology tools; computer software used for…
Serial Number: 88462960
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2019-06-10

VOYAGER

Filed: February 1, 2019
Inspection system comprised of a laser, computer software, and computer hardware for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductor…
Serial Number: 88285787
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2019-02-05

TERABEAM

Filed: November 12, 2018
Instruments for testing, inspecting, and characterizing physical properties of reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of reticles
Serial Number: 88190458
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2018-11-15

KLA+

Filed: October 3, 2018
Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics…
Serial Number: 88142130
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2018-10-06

KEEP LOOKING AHEAD

Filed: September 11, 2018
Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics…
Serial Number: 88112179
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2018-09-14

KLA

Filed: July 17, 2018
Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics…
Serial Number: 88041391
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2018-07-20

SPOT

Filed: May 16, 2018
Computer hardware and software used for testing, inspecting, characterizing, and predicting physical properties of semiconductors and integrated circuits; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits
Serial Number: 87923976
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2018-05-19

MACH

Filed: May 16, 2018
Instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for monitoring and controlling semiconductor wafer, integrated circuit, and reticle manufacturing processes; computer hardware and software used for providing…
Serial Number: 87923948
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2018-05-19

YELLOWSTONE

Filed: May 15, 2018
Instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits
Serial Number: 87921923
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2018-05-18

AXION

Filed: April 27, 2018
Metrology system for testing and characterizing physical properties of semiconductors and integrated circuits, namely critical dimension and shape; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for monitoring and controlling semiconductor…
Serial Number: 87896185
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2018-05-01

I-PAT

Filed: June 1, 2017
Computer hardware; semiconductor and wafer defect inspection systems; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing in the automotive industry; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in detecting defective semiconductor electronic components
Serial Number: 87472061
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2017-06-05

PROAIM

Filed: September 20, 2016
Computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and…
Serial Number: 87176971
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2016-09-23

XSIDE

Filed: June 16, 2016
Die sorter inspection and metrology testing equipment comprised of optical and infrared inspectors and lasers for use in the manufacturing, testing and inspection of wafers, semiconductors, and integrated circuits; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers
Serial Number: 87074433
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2016-06-20

FLASHSCAN

Filed: March 10, 2016
Photomask blank inspection tool for the use in the manufacturing, testing and inspection of photomask blanks; computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and photomask blanks; computer software for use in process control and yield management for the photomask blanks, semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and…
Serial Number: 86935805
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2016-03-14

KTDESIGNWORKS

Filed: November 12, 2015
Computer hardware; semiconductor and wafer defect inspection systems; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; a feature of semiconductor and wafer defect inspection systems for improving the detection of defects on advanced…
Serial Number: 86818669
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-11-16

5D PATTERNING CONTROL SOLUTION

Filed: July 14, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics
Serial Number: 86692587
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-07-17

5D ANALYZER

Filed: July 14, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics
Serial Number: 86692558
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-07-17

CIRCL-FOCUS

Filed: June 4, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools for semiconductor wafer shape metrology and wafer…
Serial Number: 86652230
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-06-08

CIRCL-EDGE

Filed: June 4, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools for semiconductor wafer shape metrology and wafer…
Serial Number: 86652199
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-06-08

CIRCL-AP

Filed: April 8, 2015
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools for semiconductor wafer shape metrology and wafer…
Serial Number: 86591516
Classification: Electrical and scientific apparatus
Status: New Application - Record Initialized Not Assigned To Examiner
Status Date: 2015-04-11