SUBSTRATE PROCESSING FOR GaN GROWTH
Granted: September 21, 2023
Application Number:
20230299236
Exemplary semiconductor structures may include a silicon-containing substrate. The structures may include a first layer of a first metal nitride overlying the silicon-containing substrate. The structures may include a second layer of a second metal nitride overlying the first layer of the first metal nitride. The structures may include a gallium nitride structure overlying the layer of the metal nitride.
SUBSTRATE PROCESSING FOR GaN GROWTH
Granted: September 21, 2023
Application Number:
20230299236
Exemplary semiconductor structures may include a silicon-containing substrate. The structures may include a first layer of a first metal nitride overlying the silicon-containing substrate. The structures may include a second layer of a second metal nitride overlying the first layer of the first metal nitride. The structures may include a gallium nitride structure overlying the layer of the metal nitride.
STRESS INCORPORATION IN SEMICONDUCTOR DEVICES
Granted: September 21, 2023
Application Number:
20230299199
Examples of the present technology include processing methods to incorporate stress in a channel region of a semiconductor transistor. The methods may include depositing a stressed material on an adjacent layer, where the adjacent layer is disposed between the stressed material and semiconductor material having an incorporated dopant. The adjacent layer may be characterized by an increased stress level after the deposition of the stressed material. The method may further include heating…
ELECTROSTATIC CHUCK DESIGN WITH IMPROVED CHUCKING AND ARCING PERFORMANCE
Granted: September 21, 2023
Application Number:
20230298922
Aspects of the present disclosure relate to one or more implementations of a substrate support for a processing chamber. In one implementation, a substrate support includes a body having a center, and a support surface on the body configured to at least partially support a substrate. The substrate support includes a first angled wall that extends upward and radially outward from the support surface, and a first upper surface disposed above the support surface. The substrate support also…
DYNAMIC INTERFACE FOR PROVIDING A SYMMETRIC RADIO FREQUENCY RETURN PATH
Granted: September 21, 2023
Application Number:
20230298911
Exemplary substrate processing system may include a chamber body that defines a processing region. The systems may include a liner positioned atop the chamber body. The liner may include first disconnect members. The systems may include a faceplate that is positioned atop the liner. The systems may include a support disposed within the chamber body. The support may include a plate comprising a heater. The plate may include second disconnect members. The support may include a shaft…
ION IMPLANTATION FOR REDUCED HYDROGEN INCORPORATION IN AMORPHOUS SILICON
Granted: September 21, 2023
Application Number:
20230298892
Exemplary methods of semiconductor processing may include forming a layer of amorphous silicon on a semiconductor substrate. The layer of amorphous silicon may be characterized by a first amount of hydrogen incorporation. The methods may include performing a beamline ion implantation process or plasma doping process on the layer of amorphous silicon. The methods may include removing hydrogen from the layer of amorphous silicon to a second amount of hydrogen incorporation less than the…
CHAMBER CONFIGURATIONS AND PROCESSES FOR PARTICLE CONTROL
Granted: September 21, 2023
Application Number:
20230298870
Exemplary processing methods may include forming a plasma of a cleaning precursor in a remote region of a semiconductor processing chamber. The methods may include flowing plasma effluents of the cleaning precursor into a processing region of the semiconductor processing chamber. The methods may include contacting a substrate support with the plasma effluents for a first period of time. The methods may include lowering the substrate support from a first position to a second position…
METHOD OF FORMING INTERCONNECT STRUCTURE
Granted: September 21, 2023
Application Number:
20230295804
Methods of depositing a metal film by exposing a substrate surface to a halide precursor and an organosilane reactant are described. The halide precursor comprises a compound of general formula (I): MQzRm, wherein M is a metal, Q is a halogen selected from Cl, Br, F or I, z is from 1 to 6, R is selected from alkyl, CO, and cyclopentadienyl, and m is from 0 to 6. The aluminum reactant comprises a compound of general formula (II) or general formula (III): wherein R1, R2, R3, R4, R5,…
METHODS OF GROWING METAL-CONTAINING FILMS
Granted: September 21, 2023
Application Number:
20230295803
Methods of forming metal-containing films for electronic devices (e.g., logic devices and/or memory devices) and methods for reducing equivalent oxide thickness (EOT) penalty in electronic devices are disclosed. The methods comprise exposing a substrate surface to a metal precursor, such as titanium chloride (TiCl4), a reducing agent, such as a cyclic 1,4-diene, and a reactant, ammonia (NH3), either simultaneously, partially simultaneously or separately and sequentially to form the…
DUAL CHANNEL SHOWERHEAD ASSEMBLY
Granted: September 21, 2023
Application Number:
20230294116
Dual channel showerhead assemblies are described. In some embodiments, the dual channel showerhead assemblies, which include a showerhead upper plate and a showerhead lower plate, enable delivery of mutually incompatible precursors along separate channels that mix in the process zone above a wafer. The dual channel showerhead assemblies provide at least two separate gas paths. In some embodiments, the hole design and hole distribution are configured for minimal jetting effect and plenum…
ION IMPLANTATION FOR REDUCED HYDROGEN INCORPORATION IN AMORPHOUS SILICON
Granted: September 21, 2023
Application Number:
20230298892
Exemplary methods of semiconductor processing may include forming a layer of amorphous silicon on a semiconductor substrate. The layer of amorphous silicon may be characterized by a first amount of hydrogen incorporation. The methods may include performing a beamline ion implantation process or plasma doping process on the layer of amorphous silicon. The methods may include removing hydrogen from the layer of amorphous silicon to a second amount of hydrogen incorporation less than the…
CHAMBER CONFIGURATIONS AND PROCESSES FOR PARTICLE CONTROL
Granted: September 21, 2023
Application Number:
20230298870
Exemplary processing methods may include forming a plasma of a cleaning precursor in a remote region of a semiconductor processing chamber. The methods may include flowing plasma effluents of the cleaning precursor into a processing region of the semiconductor processing chamber. The methods may include contacting a substrate support with the plasma effluents for a first period of time. The methods may include lowering the substrate support from a first position to a second position…
METHOD OF FORMING INTERCONNECT STRUCTURE
Granted: September 21, 2023
Application Number:
20230295804
Methods of depositing a metal film by exposing a substrate surface to a halide precursor and an organosilane reactant are described. The halide precursor comprises a compound of general formula (I): MQzRm, wherein M is a metal, Q is a halogen selected from Cl, Br, F or I, z is from 1 to 6, R is selected from alkyl, CO, and cyclopentadienyl, and m is from 0 to 6. The aluminum reactant comprises a compound of general formula (II) or general formula (III): wherein R1, R2, R3, R4, R5,…
METHODS OF GROWING METAL-CONTAINING FILMS
Granted: September 21, 2023
Application Number:
20230295803
Methods of forming metal-containing films for electronic devices (e.g., logic devices and/or memory devices) and methods for reducing equivalent oxide thickness (EOT) penalty in electronic devices are disclosed. The methods comprise exposing a substrate surface to a metal precursor, such as titanium chloride (TiCl4), a reducing agent, such as a cyclic 1,4-diene, and a reactant, ammonia (NH3), either simultaneously, partially simultaneously or separately and sequentially to form the…
Non-Halide Oxygen-Free Organometallic Precursors for ALD/CVD of Metallization
Granted: September 14, 2023
Application Number:
20230287022
Methods for depositing a film using a non-halide oxygen-free organometallic precursors are disclosed. The method includes forming the film on a substrate surface by exposing the surface to the precursor and a reducing agent, the precursor has a general formula (1): M-L1L2, wherein M is a metal, L1 is a first aromatic ligand having a hapticity selected from ?3, ?5, or ?6, L2 is a ligand having a hapticity selected from of ?3, ?4, ?5, ?6, ?7, ?8, ?9 or ?10. The first aromatic ligand, L1,…
DISPLAY PIXELS MADE FROM STACKED MICRO-LED STRUCTURES AND PHOTOLUMINESCENT MATERIALS
Granted: September 14, 2023
Application Number:
20230290909
Exemplary pixel structures are described that include a first light emitting diode structure, operable to generate blue light characterized by a peak emission wavelength of greater than or about 450 nm, and a second light emitting diode structure positioned on the first light emitting diode structure. The second light emitting diode structure is operable to generate ultraviolet light characterized by a peak emission wavelength of less than or about 380 nm. The pixel structures may also…
SEMICONDUCTOR CHAMBER COMPONENTS WITH MULTI-LAYER COATING
Granted: September 14, 2023
Application Number:
20230290616
Exemplary semiconductor processing chambers may include a chamber body. The chambers may include a showerhead. The chambers may include a substrate support. The substrate support may include a platen characterized by a first surface facing the showerhead. The substrate support may include a shaft coupled with the platen along a second surface of the platen opposite the first surface of the platen. The shaft may extend at least partially through the chamber body. A coating may extend…
MULTILAYER COATING FOR CORROSION RESISTANCE
Granted: September 14, 2023
Application Number:
20230290615
Exemplary methods of coating a metal-containing component are described. The methods are developed to increase corrosion resistance and improve coating adhesion to a metal substrate. The methods include forming a bonding layer on a metal substrate, where the bonding layer includes an oxide of a metal in the metal substrate. The coating methods further include depositing a stress buffer layer on the bonding layer, where the stress buffer layer is characterized by a stress buffer layer…
PACKAGE IMAGING FOR DIE LOCATION CORRECTION IN DIGITAL LITHOGRAPHY
Granted: September 14, 2023
Application Number:
20230288822
Actual physical locations of dies on a substrate package may be identified without using a full metrology scan of the substrate. Instead, one or more cameras may be used to efficiently locate the approximate location of any of the alignment features based on their expected positioning in the design file for the packages are substrate. The cameras may then be moved to locations where alignment features should be, and images may be captured to determine the actual location of the alignment…
MODULAR MULTl-DIRECTIONAL GAS MIXING BLOCK
Granted: September 14, 2023
Application Number:
20230288007
Exemplary modular gas blocks may include a body having inlet and outlet ends. The body may define a portion of a first gas path along a length of the body and may define a second gas path along a width of the body. The first gas path may include channel segments defined within the body. The inlet end may define a gas inlet that is coupled with the first gas path. The body may define first fluid ports that are coupled with the first gas path. A fluid port of the first fluid ports may be…
