IRECIPE
Filed: July 11, 2001
Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware, all for inspecting and measuring semiconductors
Serial Number: 76284120
Classification: Electrical and scientific apparatus
Status: Abandoned - No Statement Of Use Filed
Status Date: 2003-05-20
WBWS
Filed: June 18, 2001
OPTICAL SYSTEM FOR MEASURING THE CURVATURE OF A SEMICONDUCTOR WAFER, COMPOSED OF A LIGHT SOURCE AND A DETECTOR AND A PROCESSOR FOR CALCULATING THE CURVATURE OF THE WAFER AND DETERMINING THE STRESS IN A FILM DEPOSITED ON THE WAFER
Serial Number: 76272994
Registration Number: 2547288
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2012-10-19
PRECICE
Filed: May 3, 2001
Computer hardware, software, and user manuals sold as a unit, all for inspecting and measuring semiconductor devices; and equipment, namely, instruments used for measuring physical properties of semiconductors
Serial Number: 76250632
Classification: Electrical and scientific apparatus
Status: Abandoned - No Statement Of Use Filed
Status Date: 2004-01-29
ALREADY THERE.
Filed: September 25, 2000
Provision of consulting services in connection with testing and analysis for the improvement of yield in semiconductor manufacturing
Serial Number: 78027609
Registration Number: 2490981
Classification: Computer and scientific
Status: Cancelled - Section 8
Status Date: 2008-06-20
INDABA
Filed: September 7, 2000
Computer hardware and software used to implement diagnostic capabilities in semiconductor manufacturing equipment via computer networks
Serial Number: 76124892
Classification: Electrical and scientific apparatus
Status: Abandoned - No Statement Of Use Filed
Status Date: 2002-03-12
INTEGRA
Filed: June 20, 2000
RADIATION BASED INSPECTION EQUIPMENT, NAMELY, SPECTROMETERS, ELLIPSOMETERS, X-RAY REFLECTOMETERS AND THERMAL AND PLASMA WAVE METROLOGY INSTRUMENTS, FOR USE IN INSPECTING SEMICONDUCTOR WAFERS WHILE INSIDE A PROCESSING TOOL
Serial Number: 76074286
Registration Number: 2669787
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2009-08-08
ONWAFER
Filed: June 6, 2000
AUTONOMOUS SPATIALLY RESOLVED ELECTRONIC OR MECHANICAL SENSORS FOR SEMICONDUCTOR MANUFACTURING APPLICATIONS
Serial Number: 76064102
Registration Number: 2789137
Classification: Electrical and scientific apparatus
Status: Section 8 & 15-Accepted And Acknowledged
Status Date: 2009-12-04
ENVIRONMENTAL FILM DESORBER
Filed: April 14, 2000
SEMICONDUCTOR WAFER PROCESSING EQUIPMENT, NAMELY A UNIT FOR REMOVING A CONTAMINATION LAYER ON A SEMICONDUCTOR WAFER TO IMPROVE MEASUREMENT OF THE WAFER
Serial Number: 76026659
Registration Number: 2605497
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2012-03-27
YIELDNET
Filed: November 22, 1999
Computer software for yield management in semiconductor manufacturing
Serial Number: 75854874
Classification: Electrical and scientific apparatus
Status: Abandoned - No Statement Of Use Filed
Status Date: 2001-05-01
DMS
Filed: May 12, 1999
Device for the measure of paramagnetic, diamagnetic, and ferromagnetic properties, particularly remanance thickness, coercive squareness, and remanent coercivity of magnetic coating
Serial Number: 75703804
Registration Number: 2351725
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2010-12-24
MICROSENSE II
Filed: April 21, 1999
Capacitive displacement gauge, namely, a capacitive displacement gauge for high-accuracy, high-resolution measurements of semiconductor wafers and computer memory discs
Serial Number: 75688219
Registration Number: 2340946
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2010-11-12
DESORBER
Filed: April 16, 1999
SEMICONDUCTOR WAFER PROCESSING EQUIPMENT, NAMELY UNIT FOR REMOVING A CONTAMINATION LAYER ON A SEMICONDUCTOR WAFER TO IMPROVE MEASUREMENT OF THE WAFER
Serial Number: 75684267
Registration Number: 2420246
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2011-01-09
ABSOLUTE ELLIPSOMETER
Filed: April 5, 1999
OPTICAL INSPECTION EQUIPMENT COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF
Serial Number: 75673980
Registration Number: 2364232
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2011-02-11
ACE
Filed: March 9, 1999
Instruments, namely, automated semiconductor wafer test equipment, for testing and inspecting physical and electrical properties of semiconductors, computer hardware and software used for testing and inspecting physical and electrical properties of semiconductors, computer hardware and software for yield management in semiconductor manufacturing and testing
Serial Number: 75656604
Classification: Electrical and scientific apparatus
Status: Abandoned-Failure To Respond Or Late Response
Status Date: 2003-03-16
µAE
Filed: December 8, 1998
OPTICAL INSPECTION DEVICE COMPRISED OF AT LEAST TWO ELLIPSOMETERS AND A MICROPROCESSOR, FOR USE IN MONITORING CHARACTERISTICS OF SEMICONDUCTORS DURING FABRICATION
Serial Number: 75601342
Registration Number: 2808899
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2010-09-03
MICROAE
Filed: December 8, 1998
OPTICAL INSPECTION DEVICE COMPRISED OF AT LEAST TWO ELLIPSOMETERS AND A MICROPROCESSOR, FOR USE IN MONITORING CHARACTERISTICS OF SEMICONDUCTORS DURING FABRICATION
Serial Number: 75601345
Registration Number: 2825350
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2010-10-29
NANOMAPPER
Filed: November 5, 1998
Device for the characterizing a substrate namely, non-contact optical imaging comprised of a coherent light source, light detector and substrate analysis, computer hardware and software for characterizing semiconductor surface data
Serial Number: 75584669
Registration Number: 2622385
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2012-09-28
DISKMAPPER
Filed: September 17, 1998
Analytic apparatus for magnetic disks, particularly for determining magnetic properties for hard disk media for the computer industry
Serial Number: 75554566
Registration Number: 2413259
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2011-07-15
YIELDLABOR
Filed: August 20, 1998
Consulting services in the field of manufacturing of semiconductors
Serial Number: 75539355
Classification: Computer and scientific
Status: Abandoned - No Statement Of Use Filed
Status Date: 2000-09-15
INTEGRATOR
Filed: August 20, 1998
Computer software for yield management in semiconductor manufacturing and testing
Serial Number: 75539363
Registration Number: 2534460
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2011-10-27
