METALSPEC
Filed: January 21, 1997
Scientific instrument for film metrology applications, namely, metal thickness measuring apparatus, controlled by a computer, to measure deposits of metal on any surface
Serial Number: 75229074
Classification: Electrical and scientific apparatus
Status: Abandoned - No Statement Of Use Filed
Status Date: 1999-02-18
NANOMETRICS
Filed: June 25, 1996
Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials
Serial Number: 75145658
Registration Number: 2148695
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2007-07-30
IVS
Filed: September 19, 1995
Electronic measuring system comprising computer, digital image enhancement computer hardware, microscope, and edge detection computer software for measuring submicron critical dimension, overlay registration and contact holes in the production of computer chips
Serial Number: 74731161
Registration Number: 2384411
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2011-11-04
NANOMAGIC
Filed: August 11, 1994
Computer software program for metrology and industrial machine control
Serial Number: 74559902
Classification: Electrical and scientific apparatus
Status: Abandoned - No Statement Of Use Filed
Status Date: 1996-09-27
NANOSTANDARD
Filed: July 22, 1994
Film thickness reference standards for calibration of film thickness measurement instruments
Serial Number: 74552348
Registration Number: 1959370
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2005-05-25
NANOBALANCE
Filed: November 5, 1993
Electronic weighing machine to measure the average amount of material added to or removed from a sample
Serial Number: 74454673
Classification: Electrical and scientific apparatus
Status: Abandoned - No Statement Of Use Filed
Status Date: 1995-12-01
METRA
Filed: November 16, 1989
ELECTRONIC INSPECTION APPARATUS FOR SEMICONDUCTORS
Serial Number: 74002654
Registration Number: 1678055
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2002-04-07
"CAL-PAC"
Filed: February 17, 1987
FILM THICKNESS REFERENCE STANDARDS FOR FILM THICKNESS MEASUREMENT INSTRUMENTS
Serial Number: 73646735
Registration Number: 1471266
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2008-10-10
ZEE
Filed: November 12, 1985
ZIRCONIATED ELECTRON EMITTER GUN ELECTRON SOURCE
Serial Number: 73567979
Registration Number: 1453974
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2008-05-30
CWIKSCAN
Filed: July 18, 1985
ELECTRON MICROSCOPES AND PARTS THEREFOR
Serial Number: 73548677
Registration Number: 1387321
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 1992-11-04
NANOSPEC
Filed: April 14, 1981
Automatic Film Thickness Gauge
Serial Number: 73305831
Registration Number: 1217377
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2002-05-17
NANOLINE
Filed: November 24, 1980
Electro-Optical Automatic Fine Line Width Measure Apparatus
Serial Number: 73287280
Registration Number: 1205850
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2003-05-24
NANOMETRICS
Filed: November 24, 1980
Electro-Optical Instruments for Measuring Microscopic Objects
Serial Number: 73287281
Registration Number: 1207958
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2003-06-21
