PERSISTENT MEMORY MANAGEMENT
Granted: March 21, 2024
Application Number:
20240095233
Apparatuses, systems, methods, and computer program products are disclosed for persistent memory management. Persistent memory management may include replicating a persistent data structure in volatile memory buffers of at least two non-volatile storage devices. Persistent memory management may include preserving a snapshot copy of data in association with completion of a barrier operation for the data. Persistent memory management may include determining which interface of a plurality…
SUB-BLOCK STATUS DEPENDENT DEVICE OPERATION
Granted: March 14, 2024
Application Number:
20240087650
A storage device is disclosed herein. The storage device comprises: a non-volatile memory, where the non-volatile memory includes a block of N wordlines partitioned into a plurality of sub-blocks; and control circuitry coupled to the N wordlines. The control circuitry is configured to: determine a program status of an unselected sub-block of the plurality of sub-blocks before performing an operation on a selected sub-block of the plurality of sub-blocks; based on determining that the…
NAND STRING READ VOLTAGE ADJUSTMENT
Granted: March 14, 2024
Application Number:
20240086074
An apparatus includes a control circuit configured to connect to NAND strings that are connected to bit lines, where each bit line is connected to a plurality of NAND strings in a corresponding plurality of regions of a block. The control circuit is configured to apply a read voltage in read operations directed to NAND strings of the plurality of regions of the block and subsequently adjust the read voltage by a first predetermined amount for read operations directed to NAND strings of a…
DUAL-WAY SENSING SCHEME FOR BETTER NEIGHBORING WORD-LINE INTERFERENCE
Granted: March 7, 2024
Application Number:
20240079068
A storage device is disclosed herein. The storage device comprises: a non-volatile memory, where the non-volatile memory includes a block of N wordlines partitioned into a plurality of sub-blocks and the plurality of sub-blocks includes a first sub-block of a first subset of the block of N wordlines and a second sub-block of a second subset of the block of N wordlines; and control circuitry coupled to the block of N wordlines. The control circuitry is configured to: perform a program…
DYNAMIC WORD LINE BOOSTING DURING PROGRAMMING OF A MEMORY DEVICE
Granted: March 7, 2024
Application Number:
20240079063
The memory device includes a memory block, which includes a plurality of memory cells arranged in a plurality of word lines. The memory device also includes control circuitry in communication with the memory block. The control circuitry is configured to perform a programming operation to program the memory cells of a selected word line of the plurality of word lines. During the programming operation, the control circuitry is configured to apply a programming pulse VPGM to a selected word…
PRECHARGE SCHEME DURING PROGRAMMING OF A MEMORY DEVICE
Granted: March 7, 2024
Application Number:
20240079062
The memory device includes at least one memory block with source and drain sides and a plurality of memory cells arranged in a plurality of word lines. The word lines are arranged in a plurality of independently programmable and erasable sub-blocks. Control circuitry is configured to program the memory cells of a selected sub-block and determine a location of the within the at least one memory block and determine a programming condition of at least one unselected sub-block. The control…
FOGGY-FINE DRAIN-SIDE SELECT GATE RE-PROGRAM FOR ON-PITCH SEMI-CIRCLE DRAIN SIDE SELECT GATES
Granted: March 7, 2024
Application Number:
20240079061
A memory apparatus and method of operation are provided. The apparatus includes drain-side select gate transistors for coupling to a drain-side of memory holes of memory cells and configured to retain a transistor threshold voltage. The memory holes are arranged in rows comprising strings. A control means is configured to program drain-side select gate transistors of the memory holes to an initial transistor threshold voltage using pulses increasing in magnitude by a first transistor…
BUNDLE MULTIPLE TIMING PARAMETERS FOR FAST SLC PROGRAMMING
Granted: March 7, 2024
Application Number:
20240078028
Technology is disclosed herein for managing timing parameters when programming memory cells. Timing parameters used sub-clocks in an MLC program mode may also be used for those same sub-clocks in a first SLC program mode. However, in a second SLC program mode a different set of timing parameters may be used for that set of sub-clocks. Using the same set of timing parameters for the MLC program mode and the first SLC program mode saves storage space. However, the timing parameters for the…
ADAPTIVE GIDL VOLTAGE FOR ERASING NON-VOLATILE MEMORY
Granted: February 29, 2024
Application Number:
20240071533
An apparatus is provided that includes a block of memory cells having a NAND string that includes a first select transistor, and a control circuit coupled to the block of memory cells. The control circuit is configured to perform an erase operation on the block of memory cells by determining a first count of a number of times that the block of memory cells previously has been programmed and erased, determining based on the first count a first drain-to-gate voltage of the first select…
NAND MEMORY WITH DIFFERENT PASS VOLTAGE RAMP RATES FOR BINARY AND MULTI-STATE MEMORY
Granted: February 29, 2024
Application Number:
20240071544
To reduce spikes in the current used by a NAND memory die, different ramp rates are used for the pass voltage applied to unselected word lines during a program operation depending on whether data is stored in a multi-level cell (MLC) format or in a single level cell (SLC) format. These ramp rates can be determined through device characterization and stored as parameter values on the memory die. Different ramp rate interval values can also be used for the pass voltage applied to…
IN-PLACE WRITE TECHNIQUES WITHOUT ERASE IN A MEMORY DEVICE
Granted: February 29, 2024
Application Number:
20240069803
The memory device has a plurality of memory blocks including a plurality of memory cells arranged in a plurality of word lines. The memory device also includes control circuitry that is in communication with the plurality of memory blocks. The control circuitry is configured to receive a data write instruction. The control circuitry is further configured to program the memory cells of the memory blocks to an SLC format. In response to the data programmed to the memory cells of the memory…
NON-VOLATILE MEMORY WITH TIER-WISE RAMP DOWN AFTER PROGRAM-VERIFY
Granted: February 29, 2024
Application Number:
20240071529
Memory cells are arranged as NAND strings to form a block divided into sub-blocks, and each NAND string includes a dummy memory cell connected to a dummy word line. Memory cells are programmed by applying programming pulses to a selected word line in a selected sub-block with program-verify performed between pulses. Unselected NAND strings are inhibited from programming by boosting channels of the unselected NAND strings in the selected sub-block from a positive pre-charge voltage to a…
ADVANCED WINDOW PROGRAM-VERIFY
Granted: February 29, 2024
Application Number:
20240071526
A memory apparatus and operating method are provided. The apparatus includes memory cells connected to word lines and disposed in strings and configured to retain a threshold voltage corresponding to data states. A control means is configured to program and verify the memory cells during a program operation. The memory cells associated with predetermined ones of the data states are not verified until the memory cells associated with specific prior ones of the data states finish…
PLANE LEVEL DEDICATED STARTING PROGRAM VOLTAGE TO REDUCE PROGRAM TIME FOR MULTI-PLANE CONCURRENT PROGRAM OPERATION
Granted: February 29, 2024
Application Number:
20240071525
A memory apparatus and operating method are provided. The apparatus includes memory cells connected to word lines and disposed in memory holes and configured to retain a threshold voltage. The memory holes are organized in rows grouped in strings and the strings comprise a plurality of blocks which comprise planes. A control means is configured to program the memory cells connected to one of the word lines and associated with one of the strings in each of the plurality of planes and…
HYBRID SMART VERIFY FOR QLC/TLC DIE
Granted: February 29, 2024
Application Number:
20240071524
Technology is disclosed herein for smart verify in a memory system that has a four bit per cell program mode (or X4 mode) and also a three bit per cell program mode (or X3 mode). The X3 mode uses a three-bit gray code that is based on a four-bit gray code of the X4 mode. The memory system skips verify of states in the X3 mode, while using a considerable portion of the programming logic from the X4 mode. In one X3 mode the memory system skips B-state verify while the number of memory…
IN-PLACE WRITE TECHNIQUES WITHOUT ERASE IN A MEMORY DEVICE
Granted: February 29, 2024
Application Number:
20240071509
The techniques include a memory device receiving a data write instruction. The memory device programs the memory cells of the memory blocks to a one bit per memory cell (SLC) format with a first and second SLC data states. In response to the data programmed to the memory cells of the memory blocks reaching an SLC limit prior to completion of the data write instruction, without erasing the memory cells, the memory device programs at least some of the memory cells from the SLC format to a…
IN-PLACE WRITE TECHNIQUES WITHOUT ERASE IN A MEMORY DEVICE
Granted: February 29, 2024
Application Number:
20240071508
The memory device includes a plurality of memory blocks, each including a plurality of memory cells arranged in a plurality of word lines. Control circuitry is in communication with the plurality of memory blocks. In operation, the control circuitry receives a data write instruction and programs the memory cells of the memory blocks to a one bit per memory cell (SLC) format. In response to the data programmed to the memory cells of the memory blocks in the SLC format reaching an SLC…
WORD LINE DEPENDENT PASS VOLTAGE RAMP RATE TO IMPROVE PERFORMANCE OF NAND MEMORY
Granted: February 29, 2024
Application Number:
20240071493
To reduce spikes in the current used by a NAND memory die, different ramp rates for different regions, or zones, of word lines are used for the pass voltage applied to unselected word lines during a program operation. The properties of the word lines, such as their resistance and capacitance (RC) values, vary across the NAND memory array. By determining the RC values of the word lines across the array, the word lines can be broken into multiple zones based on these properties. The zones…
MIXED BITLINE LOCKOUT FOR QLC/TLC DIE
Granted: February 29, 2024
Application Number:
20240071482
Technology is disclosed herein for mixed lockout verify. In a first programming phase, prior to a pre-determined data state completing verification, a no-lockout program verify is performed. After the pre-determined data state has completed verification, a lockout program verify is performed. The no-lockout verify may include charging all bit lines associated with the group to a sensing voltage to perform. The lockout verify may include selectively charging to the sensing voltage only…
NON-VOLATILE MEMORY WITH SHARED DATA TRANSFER LATCHES
Granted: February 29, 2024
Application Number:
20240071433
An apparatus includes a control circuit that is configured to connect to an array of non-volatile memory cells. The control circuit includes a first plurality of data latches configured to connect to non-volatile memory cells of a first plane and a second plurality of data latches configured to connect to non-volatile memory cells of a second plane. The control circuit also includes a shared data transfer data latch configured for transfer of data with the first plurality of data latches…
