BEAM PROFILE ELLIPSOMETRY
Filed: August 18, 1997
OPTICAL INSPECTION EQUIPMENT, COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF
Serial Number: 75344868
Registration Number: 2518933
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2012-06-28
BPE
Filed: August 18, 1997
OPTICAL INSPECTION EQUIPMENT, COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF
Serial Number: 75344869
Registration Number: 2268211
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2010-02-17
BPR
Filed: August 18, 1997
OPTICAL INSPECTION EQUIPMENT, COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF
Serial Number: 75344870
Registration Number: 2271440
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2010-02-17
BEAM PROFILE REFLECTOMETRY
Filed: August 18, 1997
OPTICAL INSPECTION EQUIPMENT, COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF
Serial Number: 75342802
Registration Number: 2521459
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2012-06-30
THERMA-WAVE
Filed: June 4, 1997
Optical inspection equipment particularly suited for semiconductor evaluation
Serial Number: 75303235
Registration Number: 2165847
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2007-08-18
CANDELA INSTRUMENTS
Filed: June 3, 1997
Computer hardware for inspection, characterization, and evaluation of data storage and evaluation of semiconductor devices; computer software for inspecting, characterizing, and evaluating data storage and semiconductor devices
Serial Number: 75302805
Registration Number: 2265450
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2006-04-29
TRIBOSCAN
Filed: May 22, 1997
Computer hardware for use in inspection, characterization, and evaluation of data storage media; computer software for use in inspecting, characterization, and evaluation of data storage media
Serial Number: 75296770
Registration Number: 2283734
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2006-07-15
KLA TENCOR
Filed: May 14, 1997
Instruments for testing and inspecting physical and electrical properties of semiconductors; computer hardware and software used for testing and inspecting physical and electrical properties of semiconductors
Serial Number: 75291778
Registration Number: 2360529
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2009-08-12
DURASHARP
Filed: October 15, 1996
Stylus apparatus for inspecting and characterizing surfaces, including surfaces of semiconductor wafers, discs and flat panel displays and other finished surfaces including machine finished surfaces
Serial Number: 75181772
Registration Number: 2444630
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2011-05-02
ULTRALITE
Filed: October 15, 1996
Sensor apparatus for inspecting and characterizing surfaces, including surfaces of semiconductor wafers, discs, and flat panel displays and other finished surfaces including machine finished surfaces
Serial Number: 75181771
Registration Number: 2446633
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2011-03-14
HRP
Filed: October 15, 1996
Stylus instruments and computer software for inspecting and characterizing surfaces, including surfaces of semiconductor wafers, discs, flat panel displays and other finished surfaces including machine finished surfaces
Serial Number: 75181704
Registration Number: 2316918
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2010-02-08
MICROVIEW
Filed: November 22, 1995
Instrument hardware and computer software for inspecting and characterizing surfaces, namely surfaces of semiconductor wafers, discs, and flat panel displays
Serial Number: 75023317
Registration Number: 2236992
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2009-04-20
PHASE METRICS
Filed: September 7, 1995
Electro-optical-mechanical metrology and production test equipment, comprised of optical inspection and laser optics, computer hardware and computer operating software
Serial Number: 74726059
Registration Number: 2058724
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2008-02-09
QUANTOX
Filed: August 14, 1995
Electronic test system, comprising a computer, waferhandlilng robotics, and current and voltage instruments that tests semiconductors in their fabrication stages
Serial Number: 74714847
Registration Number: 2056726
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2007-03-09
SENSARRAY
Filed: March 24, 1995
Wafer calibration equipment, namely, instrument wafers, and thermocouple scanners and monitors
Serial Number: 74651089
Registration Number: 2073017
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2008-01-11
THERMAL MAP
Filed: March 17, 1995
Computer software for displaying thermal data from an instrumented wafer in a wafer fabrication system and software user guides and reference manuals packaged as a unit used in the field of semiconductor manufacturing liquid crystal display manufacturing and hard disk drive manufacturing
Serial Number: 74648132
Registration Number: 2100649
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2008-03-21
ADE
Filed: August 5, 1993
House mark for instruments and systems for the measurement and/or modification of physical, optical and/or electrical properties of objects such as semiconductor wafers, computer disks, tires, precision motion assemblies, machined parts, etc; associated hardware and software for system control, data acquisition, processing, display and communication; associated material handling subsystems and services related to customized design thereof
Serial Number: 74421412
Registration Number: 1869307
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2005-02-03
ADE
Filed: August 5, 1993
Measuring and gauging equipment and instruments for physical, optical and/or electrical properties applications in industrial and commercial settings; and computer hardware and software for use with measuring and gauging equipment
Serial Number: 74422406
Registration Number: 1946194
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2006-02-02
ULTRAGAGE
Filed: December 1, 1992
Semiconductor wafer measurement stations for the measurement of semiconductor wafer flatness, shape, thickness, conductivity type and secondary flat location, and associated computerized controllers for control and data acquisition
Serial Number: 74335774
Registration Number: 1789214
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2003-05-16
THERMA-PROBE
Filed: February 19, 1991
Optical measuring device for characterizing parameters of a sample and particularly semi-conductor wafers
Serial Number: 74140049
Registration Number: 1715145
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2012-09-28
