Image Trademark
Filed: April 4, 1990
Optical inspection measurement devices for use in the field of semiconductor manufacturing
Serial Number: 74045681
Registration Number: 1636760
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2000-09-25
OPTI-PROBE
Filed: April 4, 1990
Measurement device for evaluating dielectric films
Serial Number: 74045811
Registration Number: 1661280
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2011-01-03
ULTRASCAN
Filed: November 16, 1989
SEMICONDUCTOR TEST STATIONS
Serial Number: 74000510
Registration Number: 1633004
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2010-08-27
MICROSCAN
Filed: August 4, 1989
COMPUTER BASED STATION FOR THE AUTOMATIC CHARACTERIZATION OF SEMICONDUCTOR WAFERS AS TO THICKNESS, GLOBAL AND SITE FLATNESS, BOW, WARP, CONDUCTIVITY TYPE, RESISTIVITY AND OTHER PARAMETERS
Serial Number: 73817101
Registration Number: 1619547
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2001-03-07
SURFSCAN
Filed: April 10, 1989
SURFACE DEFECT DETECTORS
Serial Number: 73792473
Registration Number: 1615482
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2010-04-21
STATTRAX
Filed: February 13, 1987
COMPUTER PROGRAMS FOR USE IN STATISTICAL ANALYSIS OF PROCESS FLOW
Serial Number: 73644488
Registration Number: 1456334
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2007-09-26
LITHOMAP
Filed: March 22, 1984
Semiconductor Wafer Lithography Characterization System Comprised of Some or All of the Following: Programmable Computer, Graphics Terminal, Graphic Printer, and Programmable x-y Prober with Optics and Probe Card
Serial Number: 73471543
Registration Number: 1338876
Classification: Electrical and scientific apparatus
Status: Cancelled - Section 8
Status Date: 2006-03-11
OMNIMAP
Filed: March 22, 1984
SEMICONDUCTOR WAFER RESISTIVITY MAPPING SYSTEM COMPRISED OF SOME OR ALL OF THE FOLLOWING: PROGRAMMABLE COMPUTER, GRAPHICS TERMINAL, GRAPHICS PRINTER, INSTRUMENTATION INTERFACE, AND RESISTIVITY TEST UNITS
Serial Number: 73471544
Registration Number: 1340258
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2005-09-06
PROMETRIX
Filed: March 22, 1984
Computer-Based System for Evaluating the Performance of Semiconductor Wafer Processing Equipment Comprised of Resistivity Test and Mapping Systems and Lithography Characterization Systems Comprised of Some or All of the Following: Programmable Computer, Instrumentation Interface, Graphics Terminal, Graphics Printer, Resistivity Test Unit, and Programmable x-y Prober with Optics and Probe Card
Serial Number: 73471545
Registration Number: 1338877
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2005-05-06
ALPHA-STEP
Filed: February 21, 1978
METROLOGY INSTRUMENTS-NAMELY, INSTRUMENTS FOR MAPPING VERTICAL PROFILES OF SEMICONDUCTOR WAFERS, THIN FILMS, AND THE LIKE
Serial Number: 73159312
Registration Number: 1122241
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2009-08-15
MICROSENSE
Filed: January 11, 1972
NON-CONTACT DIMENSIONAL GAGING APPARATUS
Serial Number: 72412355
Registration Number: 0982523
Classification: Electrical and scientific apparatus
Status: Registered And Renewed
Status Date: 2004-05-24
