Scheduling in a multicore architecture
Granted: March 6, 2014
Application Number:
20140068619
This invention relates to scheduling threads in a multicore processor. Executable transactions may be scheduled using at least one distribution queue, which lists executable transactions in order of eligibility for execution, and multilevel scheduler which comprises a plurality of linked individual executable transaction schedulers. Each of these includes a scheduling algorithm for determining the most eligible executable transaction for execution. The most eligible executable…
INFORMATION THEORETIC SUBGRAPH CACHING
Granted: March 6, 2014
Application Number:
20140068533
Computer-implemented techniques are disclosed for verifying circuit designs using subgraph caching. A device under test (DUT) is modeled as a graph. The graph is partitioned into one or more subgraphs and problems are generated for each subgraph. Graph and subgraph problem generation is repeated numerous times throughout the verification process. Problems and sub-problems are generated and solved. When a subgraph problem is solved, the problem's variables, values, and information can be…
Determining A Design Attribute By Estimation And By Calibration Of Estimated Value
Granted: February 27, 2014
Application Number:
20140059508
A computer-implemented method of determining an attribute of a circuit includes using a computationally expensive technique to simulate the attribute (such as timing delay or slew) of a portion of the circuit, at predetermined values of various parameters (e.g. nominal values of channel length or metal width), to obtain at least a first value of the attribute. The method also uses a computationally inexpensive technique to estimate the same attribute, thereby to obtain at least a second…
TEST DESIGN OPTIMIZER FOR CONFIGURABLE SCAN ARCHITECTURES
Granted: February 27, 2014
Application Number:
20140059399
Roughly described, a scan-based test architecture is optimized in dependence upon the circuit design under consideration. In one embodiment, a plurality of candidate test designs are developed. For each, a plurality of test vectors are generated in dependence upon the circuit design and the candidate test design, preferably using the same ATPG algorithm that will be used downstream to generate the final test vectors for the production integrated circuit device. A test protocol quality…
VERY DENSE NONVOLATILE MEMORY BITCELL
Granted: February 27, 2014
Application Number:
20140056076
An asymmetric non-volatile memory bitcell is described. The bitcell comprises source and drain regions comprising carriers of the same conductivity type. A floating gate rests on top of the well, and extends over a channel region, and at least a portion of the source and drain regions. The drain region comprises additional carriers of a second conductivity type, allowing band to band tunneling. The source region comprises additional carriers of a first conductivity type, thereby…
FINFET CELL ARCHITECTURE WITH POWER TRACES
Granted: February 27, 2014
Application Number:
20140054722
A finFET block architecture suitable for use of a standard cell library, is based on an arrangement including a first set of semiconductor fins in a first region of the substrate having a first conductivity type, and a second set of semiconductor fins in a second region of the substrate, the second region having a second conductivity type. A patterned gate conductor layer including gate traces in the first and second regions, arranged over channel regions of the first and second sets of…
THERMAL ANALYSIS BASED CIRCUIT DESIGN
Granted: February 20, 2014
Application Number:
20140053124
Methods and apparatuses for circuit design to reduce power usage, such as reducing temperature dependent power usage, and/or to improve timing, such as reducing temperature dependent delay or transition time. At least one embodiment of the method implemented on a data processing system for circuit design, the method comprises determining for a first design of a circuit a first temperature solution and a first power dissipation solution, the first power dissipation solution and the first…
ARCHITECTURAL PHYSICAL SYNTHESIS
Granted: February 20, 2014
Application Number:
20140053120
The present invention discloses methods and apparatuses to design an integrated circuit. According to one aspect, a method of designing an integrated circuit comprises determining a state of a design of the integrated circuit at a high level design representation of the integrated circuit, wherein the state of the design of the integrated circuit comprises a netlist with at least one of timing data, resource information, placement information, routing information, and power data. The…
ACTIVE TRACE ASSERTION BASED VERIFICATION SYSTEM
Granted: February 13, 2014
Application Number:
20140046647
A method is presented for responding to user input by displaying when a circuit has a property expressed by an assertion based on data indicating values of signals of the circuit at a succession of times. The assertion expresses the property as a first sequence of expressions, and separately defines for each expression a corresponding evaluation time relative to the succession of times at which the expression is to be evaluated. The circuit has the property only if every expression of…
Statistical Corner Evaluation For Complex On-Chip Variation Model
Granted: February 13, 2014
Application Number:
20140047403
The invention provides a method for performing statistical static timing analysis using a novel on-chip variation model, referred to as Sensitivity-based Complex Statistical On-Chip Variation (SCS-OCV). SCS-OCV introduces complex variation concept to resolve the blocking technical issue of combining local random variations, enabling accurate calculation of statistical variations with correlations, such as common-path pessimism removal (CPPR). SCS-OCV proposes practical statistical…
OPTIMIZING A CIRCUIT DESIGN FOR DELAY USING LOAD-AND-SLEW-INDEPENDENT NUMERICAL DELAY MODELS
Granted: February 6, 2014
Application Number:
20140040851
Systems and techniques are described for optimizing a circuit design. Specifically, gate sizes in the circuit design are optimized by iteratively performing a set of operations that include, but are not limited to: selecting a portion of the circuit design (e.g., according to a reverse-levelized processing order), selecting an input-to-output arc of a driver gate in the portion of the circuit design, selecting gates in the portion of the circuit design for optimization, modeling a gate…
FINFET CELL ARCHITECTURE WITH INSULATOR STRUCTURE
Granted: February 6, 2014
Application Number:
20140035053
A finFET block architecture includes a first set of semiconductor fins having a first conductivity type, and a second set of semiconductor fins having a second conductivity type. An inter-block insulator is placed between outer fins of the first and second sets. A patterned gate conductor layer includes a first plurality of gate traces extending across the set of fins in the first block without crossing the inter-block insulator, and a second plurality of gate traces extending across the…
LAYOUT-AWARE TEST PATTERN GENERATION AND FAULT DETECTION
Granted: January 30, 2014
Application Number:
20140032156
Methods and apparatuses to generate test patterns for detecting faults in an integrated circuit (IC) are described. During operation, the system receives a netlist and a layout for the IC. The system then generates a set of faults associated with the netlist to model a set of defects associated with the IC. Next, the system determines a set of likelihoods of occurrence for the set of faults based at least on a portion of the layout associated with each fault in the set of faults. The…
DETERMINING OPTIMAL GATE SIZES BY USING A NUMERICAL SOLVER
Granted: January 30, 2014
Application Number:
20140033162
Systems and techniques are described for optimizing a circuit design by using a numerical solver. The gates sizes are optimized by modeling a set of gate optimization problems and solving the set of gate optimization problems by using a numerical solver. Modeling each gate optimization problem can include selecting a portion of the circuit design that includes a driver gate that drives one or more inputs of each gate in a set of gates, and modeling a gate optimization problem for the…
ACCURATE APPROXIMATION OF THE OBJECTIVE FUNCTION FOR SOLVING THE GATE-SIZING PROBLEM USING A NUMERICAL SOLVER
Granted: January 30, 2014
Application Number:
20140033161
Systems and techniques are described for optimizing a circuit design by using a numerical solver. Some embodiments construct a set of lower bound expressions for a parameter that is used in an approximation of an objective function. Next, the embodiments evaluate the set of lower bound expressions to obtain a set of lower bound values. The embodiments then determine a maximum lower bound value from the set of lower bound values. Next, while solving a gate sizing problem using the…
Multiple Level Spine Routing
Granted: January 30, 2014
Application Number:
20140033158
A computer implemented method for routing a net includes selecting, using one or more computer systems, a first spine routing track from a first multitude of routing tracks in accordance with a first cost function, and further in accordance with data associated with the net and the first multitude of routing tracks. The method further includes generating, using one or more computer systems, a first spine wire on the selected first spine routing track.
Multiple Level Spine Routing
Granted: January 30, 2014
Application Number:
20140033157
A computer implemented method for routing a net includes generating, using one or more computer systems, a first wire associated with the net in accordance with data associated with the net including a multitude of pins and partitioning, using the one or more computer systems, the multitude of pins into at least a first group of pins in accordance with a first cost function. The method further includes connecting, using the one or more computer systems, a second wire associated with the…
ROUTING METHOD FOR FLIP CHIP PACKAGE AND APPARATUS USING THE SAME
Granted: January 30, 2014
Application Number:
20140033156
Disclosed herein are rouging methods and devices for a flip-chip package. The flip chip includes several outer pads and several inner pads. The routing method includes: setting an outer sequence based on the arrangement order of the outer pads; setting several inner sequences based on the connection relationships between inner pads and the outer pads; calculating the longest common subsequence of each inner sequence and the outer sequence, defining the connection relationships between…
FORMAL VERIFICATION OF BIT-SERIAL DIVISION AND BIT-SERIAL SQUARE-ROOT CIRCUIT DESIGNS
Granted: January 30, 2014
Application Number:
20140033150
Methods and apparatuses are described for formally verifying a bit-serial division circuit design or a bit-serial square-root circuit design. Some embodiments formally verify a bit-serial division circuit design using a set of properties that can be efficiently proven using a bit-level solver. In some embodiments, the set of properties that are used for verifying a bit-serial division circuit design does not include any terms that multiply a w-bit partial quotient with the divisor. Some…
Fast 3D Mask Model Based on Implicit Countors
Granted: January 30, 2014
Application Number:
20140032199
Computer-readable medium and methods for photolithographic simulation of scattering. A design layout comprising a layout polygon is received. A skeleton representation of a mask shape that is created responsive to e-beam writing of the layout polygon is generated. The skeleton representation is defined by a plurality of skeleton points. Individual scattering patterns for the skeleton points are selected from a lookup table of pre-determined scattering patterns. Each of the individual…
